ELEC 571 - IMAGING AT THE NANOSCALE
Long Title: IMAGING AT THE NANOSCALE
Department: Electrical & Computer Eng.
Grade Mode: Standard Letter
Language of Instruction: Taught in English
Course Type: Seminar
Credit Hours: 3
Must be enrolled in one of the following Level(s):
Description: A survey of the techniques used in imaging micron and nanometer structures with an emphasis on applications in chemistry, physics, biology, and engineering. The course includes an introduction to scanning probe, submicron optical, and electron microscopies, as well as discussions on the fundamental and practical aspects of image acquisition, artifacts, filtering, and machine learning analysis of such data. Homeworks will involve some familiarity and proficiency with Matlab. The final project will include analysis of the student's own research data.