Course Schedule and Catalog

Long Title: IMAGING AT THE NANOSCALE

Department: Electrical & Computer Eng.

Grade Mode: Standard Letter

Course Type: Seminar

Credit Hours: 3

Description: Introduction to scanning probe instrumentation and single photon counting at the nanometer level including STM, AFM, near field optical microscopy, confocal microscopy, and optical tweezers as well as discussions on the fundamental and practical aspects of image acquisition, processing, analysis, and artifacts.