Course Schedule and Catalog

Department: Electrical & Computer Eng.

Meeting: 3:00PM - 4:15PM MW HRZ 210 (21-AUG-2017 - 1-DEC-2017) 

Session: Full Term

Grade Mode: Standard Letter

Course Type: Seminar

Language of Instruction: Taught in English

Method of Instruction: Face to Face

Credit Hours: 3

 

Section Max Enrollment: 19

Section Enrolled: 14

Enrollment data as of: 4-OCT-2023 1:55PM

 

 

Final Exam: GR Course-Dept Schedules Exam

 

Description: A survey of the techniques used in imaging micron and nanometer structures with an emphasis on applications in chemistry, physics, biology, and engineering. The course includes an introduction to scanning probe, submicron optical, and electron microscopies, as well as discussions on the fundamental and practical aspects of image acquisition, artifacts, filtering, and machine learning analysis of such data. Homeworks will involve some familiarity and proficiency with Matlab. The final project will include analysis of the student's own research data.