Course Schedule and Catalog
Course Schedule - Spring Semester 2006
Meeting location information can now be found on student schedules in ESTHER (for students) or on the Course Roster in ESTHER (for faculty and instructors).Additional information available here.
Meeting location information can now be found on student schedules in ESTHER (for students) or on the Course Roster in ESTHER (for faculty and instructors).Additional information available here.
ELEC 562 001 (CRN: 21114)
IMAGING AT THE NANOSCALE
Long Title: IMAGING AT THE NANOSCALE
Department: Electrical & Computer Eng.
Instructor: Kelly, Kevin F.
Meeting: 4:00PM - 5:15PM TR (11-JAN-2006 - 28-APR-2006)
Part of Term: Full Term
Grade Mode: Standard Letter
Course Type: Seminar
Method of Instruction: Face to Face
Credit Hours: 3
Course Syllabus:
Section Max Enrollment: 40
Section Enrolled: 21
Enrollment data as of: 12-MAY-2024 9:47AM
Description: Introduction to scanning probe instrumentation and single photon counting at the nanometer level including STM, AFM, near field optical microscopy, confocal microscopy, and optical tweezers as well as discussions on the fundamental and practical aspects of image acquisition, processing, analysis, and artifacts.