Course Schedule - Fall Semester 2012

     

Meeting location information can now be found on student schedules in ESTHER (for students) or on the Course Roster in ESTHER (for faculty and instructors).
Additional information available here.

ELEC 571 001 (CRN: 17663)

IMAGING AT THE NANOSCALE

Long Title: IMAGING AT THE NANOSCALE
Department: Electrical & Computer Eng.
Instructor: Kelly, Kevin F.
Meeting: 3:00PM - 4:29PM MW (20-AUG-2012 - 30-NOV-2012) 
Part of Term: Full Term
Grade Mode: Standard Letter
Course Type: Seminar
Method of Instruction: Face to Face
Credit Hours: 3
Course Syllabus:
 
Section Max Enrollment: 30
Section Enrolled: 28
Enrollment data as of: 18-APR-2024 5:24PM
 
Additional Fees: None
 
Final Exam: Final Exam Unknown
 
Description: A survey of the techniques used in imaging submicron and nanometer structures with an emphasis on applications in chemistry, physics, biology, and materials science. The course includes an introduction to scanning probe microscopy and single photon counting including STM, AFM, NSOM, and confocal microscopy, as well as discussions on the fundamental and practical aspects of image acquisition, analysis, and artifacts.