Course Schedule and Catalog
Course Schedule - Spring Semester 2011
Meeting location information can now be found on student schedules in ESTHER (for students) or on the Course Roster in ESTHER (for faculty and instructors).Additional information available here.
Meeting location information can now be found on student schedules in ESTHER (for students) or on the Course Roster in ESTHER (for faculty and instructors).Additional information available here.
ELEC 571 001 (CRN: 24267)
IMAGING AT THE NANOSCALE
Long Title: IMAGING AT THE NANOSCALE
Department: Electrical & Computer Eng.
Instructor: Kelly, Kevin F.
Meeting: 1:00PM - 2:15PM TR (10-JAN-2011 - 22-APR-2011)
Part of Term: Full Term
Grade Mode: Standard Letter
Course Type: Seminar
Method of Instruction: Face to Face
Credit Hours: 3
Course Syllabus:
Section Max Enrollment: 30
Section Enrolled: 23
Enrollment data as of: 23-APR-2024 7:17AM
Final Exam: No Final Exam
Description: A survey of the techniques used in imaging submicron and nanometer structures with an emphasis on applications in chemistry, physics, biology, and materials science. The course includes an introduction to scanning probe microscopy and single photon counting including STM, AFM, NSOM, and confocal microscopy, as well as discussions on the fundamental and practical aspects of image acquisition, analysis, and artifacts.